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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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Phidix Motion Controls (Shanghai) Co., Ltd.

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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Brand Name :	Phidix
Model Number :	M22006
Certification :	IATF16949，CE
Price :	Negotiable
Payment Terms :	L/C, D/A, D/P, T/T, Western Union
Supply Ability :	10 PCS/Month
Delivery Time :	40 Work Days

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

Magnification 1X-300000X Scanning Electron Microscope 3nm Resolution with Optional BSE,EDS,EBSD,WDS and CL

M22006 is a cost-effective tungsten filament scanning electron microscope for the observation of nanoscale microstructures. It has a magnification of up to 300,000x and a resolution better than 3nm and is also equipped with a 370mm diameter sample chamber. It is a high-performance scanning electron microscope with ultra-high resolution and excellent image quality. The magnification is continuously adjustable, and clear images with high brightness can be obtained in different fields of view. The depth of field is large and the image is rich in stereo. Equipped with a large sample chamber and low voltage mode greatly expands the range of applications.

Specials:

- Magnification Max 300000X.

- Signal Detection: Secondary Electron Detector (SED).

- Accelerating Voltage: 1~30KV, High image resolution.

- BSE/EDS/EBSD/WDS/CL is optional, for component analysis.

- High Vacuum System.

- Three Axis Automatic (Standard).

Item	Specification	M22006
Resolution	3nm@30kV(SE)	●
Magnification	1X~300000X	●
Accelerating Voltage	1~30kV	●
Signal Detection	Secondary Electron Detector (SED)	●
Electron Gun	Pre-aligned medium-sized fork-type tungsten filament	●
Auto Function	Auto Brightness Contrast, Auto Focus	●
StageSystem/Movement	Control Method: Automatic Valve	●
	Turbomolecular Pump:240 L/S	●
	Mechanical Pump:12 m³/h(50 Hz)	●
	Camera:Optical Navigation,Monitoring in the Sample Chamber	●
	Sample Stage Configuration,Three Axis Automatic (Standard)	●
	X: 0~100mm	●
	Y: 0~100mm	●
	Z: 0~60mm	●
	Max Sample Diameter: 370mm	●
	Max Sample Height: 68mm	●
	Five Axis Automatic (Optional)	○
	X: 0~115mm	○
	Y: 0~115mm	○
	Z: 0~65mm	○
	R: 360°	○
	T: -10°~75°	○
	Max Sample Diameter: 370mm	○
	Max Sample Height: 73mm	○
Vacuum System	Better than 9 X 10-4 Pa under High Vacuum	●
Optional Detector	BSEEDSEBSDWDSCL	○
Imaging System	Image Pixel ≤ 6144 x 4096	●
Imaging System	Image Format: TIFF, JPG, BMP, PNG	●
Software	Language: Chinese / English	●
	Operating System: Windows	●
	Navigation: Optical Navigation, Gesture Quick Navigation	●
	Special Function: Dynamic Astigmatism	●
Installation Requirements	Space: L≥ 3000 mm, W ≥ 4000 mm, H ≥ 2300 mm	●
	Door Size: W ≥ 900 mm, H ≥ 2000 mm	●
	Temperature: 20 ℃ to 25 ℃	●
	Humidity: ≤ 50%	●
	Noise: ≤ 45dB	●
	Power Supply: AC 220 V (±10 %), 50 Hz, 2 kVA	●
	Ground Wire: Less than 4 Ω	●
	AC Magnetic Field: Less than 100 nT	●

Note: ● means standard, ○ means optional

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BSE EDS Tabletop Scanning Electron Microscope 1X-300000X 3nm Resolution

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